@article {9796556,
	title = {A Design Flow and Tool for Avoiding Asymmetric Aging},
	journal = {IEEE Design \& Test},
	volume = {39},
	number = {6},
	year = {2022},
	pages = {111-118},
	keywords = {aging, Asymmetric Aging, Automation, Bias Temperature Instability, degradation, EDA, Electronic Design Automation, Flow modeling, Integrated circuit modeling, Integrated circuit reliability, Logic gates, Reliability, System analysis and design, Timing, Transistors},
	doi = {10.1109/MDAT.2022.3183552},
	author = {Gabbay, Freddy and Mendelson, Avi and Salameh, Basel and Ganaiem, Majd}
}
